Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
Inventor
active
Dynamically reconfigurable shared scan-in test architecture
Dynamically reconfigurable shared scan-in test architecture
Dynamically reconfigurable shared scan-in test architecture
Dynamically reconfigurable shared scan-in test architecture
Dynamically reconfigurable shared scan-in test architecture
No associations
LandOfFree
Suryanarayana Duggirala does not yet have a rating. At this time, there are no reviews or comments for this inventor.
If you have personal experience with Suryanarayana Duggirala, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Suryanarayana Duggirala will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-P-2034320