Dynamically reconfigurable shared scan-in test architecture

Details Dynamically reconfigurable shared scan-in test architecture Dynamically reconfigurable shared scan-in test architecture

2009-08-11

2010-11-16

Chung, Phung M (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S729000

Reexamination Certificate

active

07836367

ABSTRACT:
A low overhead dynamically reconfigurable shared scan-in test architecture is provided. This test architecture advantageously allows for changing scan inputs during the scan operation on a per shift basis. The flexibility of reconfiguring the scan input to scan chain mapping every shift cycle can advantageously reduce both test data volume and test application time.

REFERENCES:
patent: 5696771 (1997-12-01), Beausang et al.
patent: 5703789 (1997-12-01), Beausang et al.
patent: 5903466 (1999-05-01), Beausang et al.
patent: 5949626 (1999-09-01), Sato et al.
patent: 5983380 (1999-11-01), Motika et al.
patent: 6018815 (2000-01-01), Baeg
patent: 6055649 (2000-04-01), Deao et al.
patent: 6212656 (2001-04-01), Fosco et al.
patent: 6442723 (2002-08-01), Koprowski et al.
patent: 6516432 (2003-02-01), Motika et al.
patent: 6543020 (2003-04-01), Rajski et al.
patent: 6557129 (2003-04-01), Rajski et al.
patent: 6560147 (2003-05-01), Yoshiyama
patent: 6587996 (2003-07-01), Reohr, Jr. et al.
patent: 6662327 (2003-12-01), Rajski
patent: 6684358 (2004-01-01), Rajski et al.
patent: 6708303 (2004-03-01), Gallia
patent: 6807645 (2004-10-01), Angelotti et al.
patent: 6904553 (2005-06-01), Brown
patent: 6961886 (2005-11-01), Motika et al.
patent: 6990619 (2006-01-01), Kapur et al.
patent: 7137053 (2006-11-01), Khoche et al.
patent: 7237162 (2007-06-01), Wohl et al.
patent: 7412637 (2008-08-01), Wang et al.
patent: 7418640 (2008-08-01), Kapur et al.
patent: 7596733 (2009-09-01), Kapur et al.
patent: 2003/0046623 (2003-03-01), Khoche et al.

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