4. Excavating

Steven Frederick Oakland

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D flip-flop structure with flush path for high-speed...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Double-edge-triggered flip-flop providing two data...

Miscellaneous active electrical nonlinear devices – circuits – and – Signal converting – shaping – or generating – Particular stable state circuit
Reexamination Certificate

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Method and apparatus for initializing an integrated circuit...

Electronic digital logic circuitry – Multifunctional or programmable
Reexamination Certificate

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Scan-bypass architecture without additional external latches

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Patent

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Scan-bypass architecture without additional external latches

Excavating
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Profile ID: LFUS-PAI-P-1089223

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