4. Semiconductor device manufacturing: process
  5. Repair or restoration

Steven A. Michaelson

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Method of making memory chips using memory tester providing fast

Semiconductor device manufacturing: process – Repair or restoration
Patent

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Redundancy analysis method and apparatus for ATE

Error detection/correction and fault detection/recovery – Pulse or data error handling – Replacement of memory spare location – portion – or segment
Reexamination Certificate

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Semiconductor memory tester with hardware accelerators

Excavating
Patent

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Profile ID: LFUS-PAI-P-1246077

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