4. Optics: measuring and testing
  5. Dimension

Srinivas Doddi

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Clustering for data compression

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
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Clustering for data compression

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Integrated circuit profile value determination

Optics: measuring and testing – Dimension – Width or diameter
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Metrology hardware adaptation with universal library

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Optical metrology of structures formed on semiconductor...

Data processing: artificial intelligence – Machine learning
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