4. Optics: measuring and testing
  5. By polarized light examination
  6. With birefringent element

Soichi Katagiri

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Charged particle beam apparatus

Radiant energy – Inspection of solids or liquids by charged particles – Electron probe type
Reexamination Certificate

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Charged particle beam apparatus

Radiant energy – Inspection of solids or liquids by charged particles – Electron probe type
Reexamination Certificate

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Method and apparatus for measuring minute displacement by subjec

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Method for manufacturing a semiconductor device that...

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate

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Method of forming patterns and apparatus for carrying out the sa

Photocopying – Projection printing and copying cameras – Step and repeat
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Profile ID: LFUS-PAI-P-157071

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