4. Radiant energy
  5. Irradiation of objects or material
  6. Irradiation of semiconductor devices

Shuzo Hattori

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Method and device for detecting defects of patterns in microelec

Radiant energy – Irradiation of objects or material – Irradiation of semiconductor devices
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Substrate of a hybrid ic, method of forming a circuit pattern an

Coating processes – Electrical product produced – Welding electrode
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Substrate of a hybrid IC, method of forming a circuit pattern an

Stock material or miscellaneous articles – Structurally defined web or sheet – Discontinuous or differential coating – impregnation or bond
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X-ray generator with grooved rotary anode

X-ray or gamma ray systems or devices – Source – Electron tube
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Profile ID: LFUS-PAI-P-451813

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