4. Data processing: measuring, calibrating, or testing
  5. Testing system
  6. Of circuit

Shozo Hirano

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Design method for semiconductor integrated circuit...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Electro-migration verifying apparatus, electro-migration...

Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Physical design processing
Reexamination Certificate

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Method for estimating EMI in a semiconductor device

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate

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Profile ID: LFUS-PAI-P-3005324

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