Method for estimating EMI in a semiconductor device

Details Method for estimating EMI in a semiconductor device Method for estimating EMI in a semiconductor device

2006-10-10

2006-10-10

Wachsman, Hal D. (Department: 2857)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

C702S118000, C702S065000, C702S064000, C716S030000

Reexamination Certificate

active

07120551

ABSTRACT:
The resistance value of a supply line (Rline), the resistance value of a decoupling capacitor (Rcap), and the resistance value of a transistor (Rmos) are separately calculated from mask layout information of a semiconductor integrated circuit. The resistance value between external terminals (Ri) is calculated from the resistance value Rline, the resistance value Rcap, and the resistance value Rmos.

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patent: 2003/0057966 (2003-03-01), Shimazaki et al.
patent: 2003-30273 (2003-01-01), None

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