4. Image analysis
  5. Histogram processing
  6. For setting a threshold

Shogo Matsui

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Image data inspecting method and apparatus providing for equal s

Image analysis – Applications – Manufacturing or product inspection
Patent

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Inspection method of photomask reticle for semiconductor device

Image analysis – Histogram processing – For setting a threshold
Patent

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System for inspecting exposure pattern data of semiconductor int

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Patent

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Profile ID: LFUS-PAI-P-1114703

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