Image data inspecting method and apparatus providing for equal s

Details Image data inspecting method and apparatus providing for equal s Image data inspecting method and apparatus providing for equal s

1994-11-15

1998-12-15

Couso, Jose L.

Image analysis

Applications

Manufacturing or product inspection

G06K 900

Patent

active

058504672

ABSTRACT:
An image data inspecting method detects whether or not a pattern described by a first image data and a pattern described by a second image data match. This method includes the steps of (a) carrying out a sizing process on the first and second image data so that the patterns described thereby are at least enlarged or reduced by the same amount, and (b) comparing the first and second image data which are processed in the step (a) to determine whether or not the processed first and second image data match.

REFERENCES:
patent: 4797939 (1989-01-01), Hoki et al.
patent: 4809341 (1989-02-01), Matsui et al.
patent: 4853967 (1989-08-01), Mandeville
patent: 5144681 (1992-09-01), Kitakado et al.
patent: 5146509 (1992-09-01), Hara et al.
Patent Abstracts of Japan, vol. 11, No. 100 (P-561), Mar. 28, 1987 & JP-A-61 251705 (Sumitomo Metal Ind Ltd), Nov. 8, 1986.

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