4. Active solid-state devices (e.g., transistors, solid-state diode
  5. Combined with electrical contact or lead
  6. Of specified material other than unalloyed aluminum

Sheng-Jen Wang

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Automatic intelligent yield improving and process parameter...

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Method and related system for semiconductor equipment early...

Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation
Reexamination Certificate

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Method and related system for semiconductor equipment...

Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation
Reexamination Certificate

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Method for automatically controlling defect -specification...

Data processing: generic control systems or specific application – Specific application – apparatus or process – Product assembly or manufacturing
Reexamination Certificate

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Method of managing wafer defects

Image analysis – Applications – Manufacturing or product inspection
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Profile ID: LFUS-PAI-P-2609936

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