4. Fishing, trapping, and vermin destroying

Scott A. Chalmers

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Determining wafer orientation in spectral imaging

Optics: measuring and testing – Dimension – Thickness
Reexamination Certificate

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Method and apparatus for high-speed thickness mapping of...

Optics: measuring and testing – Dimension – Thickness
Reexamination Certificate

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Method for accurate growth of vertical-cavity surface-emitting l

Fishing – trapping – and vermin destroying
Patent

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Method of deposition by molecular beam epitaxy

Single-crystal – oriented-crystal – and epitaxy growth processes; – Forming from vapor or gaseous state – With decomposition of a precursor
Patent

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Methods of making nanometer period optical gratings

Fishing – trapping – and vermin destroying
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Profile ID: LFUS-PAI-P-931289

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