4. Electricity: measuring and testing
  5. Impedance, admittance or other quantities representative of...
  6. Lumped type parameters

Sani Richard Nassif

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Apparatus and method for clock skew measurement

Miscellaneous active electrical nonlinear devices – circuits – and – Signal converting – shaping – or generating – Synchronizing
Reexamination Certificate

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Apparatus for measuring capacitance of a semiconductor device

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Decoupling capacitor sizing and placement

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Method and apparatus for characterized parasitic capacitance bet

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent

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Method and apparatus for reducing power consumption for...

Electric power conversion systems – Current conversion – With condition responsive means to control the output...
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Profile ID: LFUS-PAI-P-1289988

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