4. Electricity: measuring and testing
  5. Fault detecting in electric circuits and of electric components
  6. Of individual circuit component or element

Samsung Electronis Co., Ltd.

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Mask for crystallizing polysilicon and a method for forming...

Semiconductor device manufacturing: process – Formation of semiconductive active region on any substrate – Amorphous semiconductor
Reexamination Certificate

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NOR flash memory device and method of shortening a program time

Static information storage and retrieval – Floating gate – Particular connection
Reexamination Certificate

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Probe control method for leveling probe pins for a probe test se

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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Programming method of a non-volatile memory device having a...

Static information storage and retrieval – Floating gate – Particular biasing
Reexamination Certificate

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