Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1996-05-16
1998-12-01
Ballato, Josie
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
324754, G01R 3102
Patent
active
058444211
ABSTRACT:
A probe control method of a probe station which levels the probe pins before testing a large area substrate such as a thin film transistor circuit substrate using a probe station, which includes the steps of connecting a pin of a probe station to a resistance material; measuring and reading the resistance between adjacent pins using a resistance measuring device; and leveling the probe pins using a pin control device at the probe station.
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Lee Gun-Won
Lee Si-Hyoung
Park Seung-Hwan
Yang Kyoung-Ho
Ballato Josie
Phung Anh
Samsung Electronis Co., Ltd.
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