4. Measuring and testing
  5. Coating material: ink adhesive and/or plastic

Sachiko Yabe

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Dielectric substrate with reflecting films

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
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Fabrication method for device structure having transparent...

Semiconductor device manufacturing: process – Formation of semiconductive active region on any substrate – On insulating substrate or layer
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Method for manufacturing electronic device

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
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Method of manufacturing an alignment mark

Semiconductor device manufacturing: process – Formation of electrically isolated lateral semiconductive... – Having substrate registration feature
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Method of measuring film thickness distribution

Measuring and testing – Coating material: ink adhesive and/or plastic
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Profile ID: LFUS-PAI-P-2533060

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