4. Dynamic information storage or retrieval
  5. Binary pulse train information signal
  6. Binary signal processing for controlling recording light...

Roderick Koehle

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Method for checking periodic structures on lithography masks

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Method for determining the construction of a mask for the...

Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation
Reexamination Certificate

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Method for inspection of periodic grating structures on...

Optics: measuring and testing – By alignment in lateral direction
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Method for optimizing a photolithographic mask

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Method for optimizing a photolithographic mask

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2108890

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