4. Data processing: generic control systems or specific application
  5. Specific application, apparatus or process
  6. Product assembly or manufacturing

Robert Walter Berry, Jr.

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AC LSSD/LBIST test coverage enhancement

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Method and apparatus for test case evaluation using a cyclic...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
Reexamination Certificate

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System and method for semiconductor identification chip read...

Data processing: generic control systems or specific application – Specific application – apparatus or process – Product assembly or manufacturing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2171829

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