Method and apparatus for test case evaluation using a cyclic...

Details Method and apparatus for test case evaluation using a cyclic... Method and apparatus for test case evaluation using a cyclic...

2005-09-06

2005-09-06

Lamarre, Guy J. (Department: 2133)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital data error correction

Reexamination Certificate

active

06941504

ABSTRACT:
The present invention provides an apparatus and a method for testing one or more electrical components. The apparatus and method provide a CRC function that is used to calculate a CRC value for a portion of memory. The CRC value is compared with an expected CRC value to determine if the electrical component passed or failed the test.

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patent: 6668196 (2003-12-01), Villegas et al.

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