Data processing: generic control systems or specific application – Specific application – apparatus or process – Product assembly or manufacturing
Reexamination Certificate
2011-05-31
2011-05-31
Masinick, Michael D (Department: 2128)
Data processing: generic control systems or specific application
Specific application, apparatus or process
Product assembly or manufacturing
C714S721000
Reexamination Certificate
active
07953510
ABSTRACT:
A system and method for semiconductor identification chip read out is presented. A user uses a stand-alone handheld device to extract product data, which includes manufacturing process attributes, from a semiconductor device. The semiconductor device couples to the hand held device through a subset of pins, such as a power pin, a ground pin, a clock in pin, and a data out pin. When coupled, the handheld device provides a clock signal to the semiconductor device. In turn, on chip logic within the semiconductor device detects the clock signal and gathers internal product data. Once gathered, the on chip logic provides the product data to the hand held device through the data out pin for a user to view. As a result, the user may track semiconductor devices more efficiently.
REFERENCES:
patent: 5721741 (1998-02-01), Deas
patent: 6003769 (1999-12-01), Ebbing
patent: 6496596 (2002-12-01), Zika et al.
patent: 6530045 (2003-03-01), Cooper et al.
patent: 7557596 (2009-07-01), Eldridge et al.
patent: 2002/0135391 (2002-09-01), Rearick et al.
patent: 2003/0219913 (2003-11-01), Pourkeramati et al.
patent: 2005/0225347 (2005-10-01), Khandros et al.
patent: 2007/0178612 (2007-08-01), Bradl et al.
“Modern Test Techniques: Tradeoffs, Synergies, and Scalable Benefits”,—Volkerink et al, Agilent Laboratories, Nov. 8, 2002.
Berry, Jr. Robert Walter
Conley Christopher R.
Kuruts Christopher J.
Kuruts James P.
International Business Machines - Corporation
Masinick Michael D
Talpis Matthew B.
VanLeeuwen & VanLeeuwen
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