4. Electricity: measuring and testing
  5. Fault detecting in electric circuits and of electric components
  6. Of individual circuit component or element

Robert C. Aitken

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Dynamically adaptable memory

Static information storage and retrieval – Read/write circuit – Including reference or bias voltage generator
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Flow for vector capture

Data processing: structural design – modeling – simulation – and em – Simulating electronic device or electrical system – Circuit simulation
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Integrated circuit with scan flip-flop

Miscellaneous active electrical nonlinear devices – circuits – and – Signal converting – shaping – or generating – Particular stable state circuit
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Modular embedded test system for use in integrated circuits

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2129145

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