4. Static information storage and retrieval
  5. Read only systems
  6. Fusible

Richard S. Kontra

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In-line electrical monitor for measuring mechanical stress...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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In-line electrical monitor for measuring mechanical stress...

Semiconductor device manufacturing: process – With measuring or testing
Reexamination Certificate

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Method of controlling grain size in a polysilicon layer and...

Semiconductor device manufacturing: process – Formation of semiconductive active region on any substrate – Polycrystalline semiconductor
Reexamination Certificate

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Method of controlling grain size in a polysilicon layer and...

Active solid-state devices (e.g. – transistors – solid-state diode – Bipolar transistor structure
Reexamination Certificate

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Programmable semiconductor device

Static information storage and retrieval – Read only systems – Fusible
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2315964

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