4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Digital data error correction

Richard K. Eguchi

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Auto-tuneable reference circuit for flash EEPROM products

Static information storage and retrieval – Read/write circuit – Differential sensing
Reexamination Certificate

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Electrical erasable programmable memory transconductance...

Static information storage and retrieval – Floating gate – Particular biasing
Reexamination Certificate

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In-circuit Vt distribution bit counter for non-volatile...

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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Integrated circuit with test pad structure and method of...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Memory device with adjustable read reference based on ECC...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2196505

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