In-circuit Vt distribution bit counter for non-volatile...

Details In-circuit Vt distribution bit counter for non-volatile... In-circuit Vt distribution bit counter for non-volatile...

2006-06-07

2009-10-06

Le, Vu A (Department: 2824)

Static information storage and retrieval

Read/write circuit

Testing

C365S185240, C365S185030, C365S185180

Reexamination Certificate

active

07599236

ABSTRACT:
Integrated testing components and testing algorithm on a non-volatile memory module provide faster Vt (threshold voltage) distributions during the module verification process. The memory module includes address and voltage scanning components and a bit counter for storing the number of 0's or 1's for a specified voltage. As the range of addresses are scanned across a range of voltages, the instances of the count value being counted is accumulated by the bit counter. Automated Tester Equipment (ATE) reads the accumulated count value for each tested voltage.

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patent: 2008/0104459 (2008-05-01), Uchikawa et al.

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