4. Optics: measuring and testing
  5. Inspection of flaws or impurities
  6. Bore inspection

Rainer Florian Schnabel

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Aluminum-based metallization exhibiting reduced...

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate

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Circuit for an electronic semiconductor module

Electronic digital logic circuitry – With test facilitating feature
Reexamination Certificate

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Dual damascene with bond pads

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Patent

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Integrated circuit having a test circuit, and method of...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Locally folded split level bitline wiring

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate

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Profile ID: LFUS-PAI-P-437827

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