4. Measuring and testing
  5. Surface and cutting edge testing
  6. Roughness

Quesant Instrument Corporation

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Detection system for atomic force microscopes

Measuring and testing – Surface and cutting edge testing – Roughness
Reissue Patent

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Detection system for atomic force microscopes

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

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Light modulated detection system for atomic force microscopes

Radiant energy – Photocells; circuits and apparatus – Optical or pre-photocell system
Patent

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Method of engaging the scanning probe of a scanning probe micros

Radiant energy – Inspection of solids or liquids by charged particles – Methods
Patent

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Programmable, scanned-probe microscope system and method

Radiant energy – Inspection of solids or liquids by charged particles – Methods
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