4. Data processing: measuring, calibrating, or testing
  5. Testing system
  6. Of circuit

Paul J. Tracy

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Automatic test configuration generation facilitating repair...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Feature control circuitry for testing integrated circuits

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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Techniques for automatically generating tests for...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2962658

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