4. Static information storage and retrieval
  5. Addressing
  6. Plural blocks or banks

Paul D. Berndt

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Apparatus and method to test high speed devices with a low...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate

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Multiport memory scheme

Static information storage and retrieval – Addressing – Plural blocks or banks
Reexamination Certificate

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Scan testing of integrated circuits with high-speed serial...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Scan testing of integrated circuits with high-speed serial...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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System and method for testing multiple integrated circuits...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Profile ID: LFUS-PAI-P-2150946

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