Apparatus and method to test high speed devices with a low...

Details Apparatus and method to test high speed devices with a low... Apparatus and method to test high speed devices with a low...

2005-10-25

2005-10-25

Assouad, Patrick (Department: 2857)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

C702S117000, C702S122000, C702S182000, C710S110000, C714S044000

Reexamination Certificate

active

06959257

ABSTRACT:
An apparatus coupled to a low speed tester and a device is disclosed. The device may have a first speed faster than a second speed of the low speed tester. The apparatus may be configured to allow the low speed tester to perform high speed tests of the device at the first speed.

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