4. Aeronautics and astronautics
  5. Aircraft power plants
  6. Mounting

Patrick Huet

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Flexible hybrid defect classification for semiconductor...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate

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Jet engine suspension

Aeronautics and astronautics – Aircraft power plants – Mounting
Reexamination Certificate

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Methods and systems for generating an inspection process for...

Image analysis – Applications – Manufacturing or product inspection
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Wafer inspection systems and methods for analyzing...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Wafer inspection systems and methods for analyzing...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2696999

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