4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Memory testing

Norifumi Kobayashi

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Delay element testing apparatus and integrated circuit having te

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Parameter related to the reproduction or fidelity of a...
Patent

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Memory analyzing apparatus

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Patent

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Semiconductor integrated circuit device and testing method...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Variable delay circuit

Miscellaneous active electrical nonlinear devices – circuits – and – Signal converting – shaping – or generating – Having specific delay in producing output waveform
Reexamination Certificate

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Variable delay element test circuit

Measuring and testing – Instrument proving or calibrating – Timing apparatus
Reexamination Certificate

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Profile ID: LFUS-PAI-P-759892

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