4. Static information storage and retrieval
  5. Read/write circuit
  6. Testing

Nobutoshi Tsunesada

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Non-volatile semiconductor memory device

Static information storage and retrieval – Floating gate – Particular biasing
Reexamination Certificate

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Semiconductor device and method of testing semiconductor device

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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Semiconductor integrated circuit device and method of...

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2279283

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