Semiconductor integrated circuit device and method of...

Details Semiconductor integrated circuit device and method of... Semiconductor integrated circuit device and method of...

2011-06-21

2011-06-21

Ho, Hoai V (Department: 2827)

Static information storage and retrieval

Read/write circuit

Testing

C714S730000

Reexamination Certificate

active

07965568

ABSTRACT:
A semiconductor integrated circuit device includes a first chip that is directly accessible from outside, a second chip that transmits and receives data to and from the first chip, the second chip being not directly accessible from outside, and a through circuit that is provided in the first chip and transmits first and second test signals input from an external device to the second chip, wherein the through circuit includes a first signal transmission path to generate a first signal by synchronizing the first test signal to a clock signal input from the external device and to output it to the second chip and a second signal transmission path to generate a second signal by synchronizing the second test signal to a test clock signal input from the external device and to output it to the second chip.

REFERENCES:
patent: 2005/0289428 (2005-12-01), Ong
patent: 2006/0026475 (2006-02-01), Arnold et al.
patent: 2004-158098 (2004-06-01), None

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