4. Electricity: measuring and testing
  5. Fault detecting in electric circuits and of electric components
  6. Of individual circuit component or element

Neeraj Khurana

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Dynamic structural coupling mechanism for reducing optical...

Television – Special applications – Microscope
Reexamination Certificate

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Emission microscope

Facsimile and static presentation processing – Facsimile – Recording apparatus
Patent

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Fast software fault detection and notification to a backup unit

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
Reexamination Certificate

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High sensitivity thermal radiation detection with an...

Optical: systems and elements – Compound lens system – Microscope
Reexamination Certificate

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Image emission microscope with improved image processing capabil

Facsimile and static presentation processing – Static presentation processing – Attribute control
Patent

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Profile ID: LFUS-PAI-P-1417438

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