Image emission microscope with improved image processing capabil

Details Image emission microscope with improved image processing capabil Image emission microscope with improved image processing capabil

1988-01-04

1989-03-07

Groody, James J.

Facsimile and static presentation processing

Static presentation processing

Attribute control

358101, 358166, 358211, 382 18, H04N 718

Patent

active

048110906

ABSTRACT:
An emission microscope includes integrating and enhancing devices operating in parallel for optimizing the image of a scanned semiconductor device. Integration is terminated when sufficient clarity is acquired. The system further incorporates adaptive histogram matching using a noise distribution curve. Those pixels not meeting a predetermined intensity level are deleted to further enhance image display.

REFERENCES:
patent: 4394744 (1983-07-01), Wrench, Jr.
patent: 4441205 (1984-04-01), Berkin et al.
patent: 4592089 (1986-05-01), Hartman
patent: 4667231 (1987-05-01), Pryor
patent: 4680635 (1987-07-01), Khurana

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