Emission microscope

Details Emission microscope Emission microscope

1986-04-01

1987-07-14

Britton, Howard W.

Facsimile and static presentation processing

Facsimile

Recording apparatus

358101, 358106, 358225, H04N 718

Patent

active

046806350

ABSTRACT:
An emission microscope providing time resolution and high sensitivity to the viewing of light emitted from semiconductor devices is described. The present invention comprises a microscope optic system coupled to an image intensifier. An integrated circuit is viewed with the microscope optics and is stimulated with current flow. As a result of different phenomena, (oxide current, avalanching, and forward biased p-n junctions) light is emitted from the circuit. The image intensifier magnifies the light signal produced by the microscope optics. The output of the intensifier is coupled to a solid-state (CID or CCD) camera. The CID camera outputs a TV signal which is coupled to an image processing computer. The image processing computer controls image enhancement as well as noise reduction. The image processing computer is coupled to an output such as a monitor, a recorder, a printer, or any other suitable display.

REFERENCES:
patent: 4555731 (1985-11-01), Zinchuk
patent: 4570180 (1986-02-01), Baier
patent: 4651200 (1987-03-01), Lepley
NASA Tech. Brief (Spring 1979) p. 18, "Improving Low-Illumination Video".
1975 Int. Conf. on the Application of Charge-Coupled Devices, Currie, "An Intensified CCD for Extremely Low Light Level Operation", pp. 155-163.

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