4. Data processing: database and file management or data structures
  5. Database design
  6. Data structure types

Naresh U. Mehta

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Distributed test system and method

Data processing: measuring – calibrating – or testing – Testing system – Including multiple test instruments
Reexamination Certificate

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Method and device for test vector analysis

Semiconductor device manufacturing: process – With measuring or testing
Reexamination Certificate

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Method and device for test vector analysis

Boots – shoes – and leggings
Patent

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System and method for performing database query using a marker t

Data processing: database and file management or data structures – Database design – Data structure types
Patent

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Profile ID: LFUS-PAI-P-1429751

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