Method and device for test vector analysis

Details Method and device for test vector analysis Method and device for test vector analysis

1996-10-09

1999-07-13

Teska, Kevin J.

Boots, shoes, and leggings

39518306, 39518309, G06F 1750

Patent

active

059235675

ABSTRACT:
A method and device for testing and manufacturing integrated circuits such as microprocessors, memories, ASICs, programmable logic, and other types of integrated circuits. A test system is designed to test the relevant integrated circuit. A device under test emulator responds to the test system. If modifications are needed, the test system can be modified, and used to test actual devices.

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