4. Error detection/correction and fault detection/recovery
  5. Data processing system error or fault handling
  6. Reliability and availability

Narayanan Sridhar

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Apparatus for scan test of SRAM for microprocessors having full

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
Patent

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Apparatus for scan test of SRAM for microprocessors having full

Excavating
Patent

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Method and apparatus for scan test of SRAM for microprocessor wi

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Patent

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Method for scan test of SRAM for microprocessors having full sca

Excavating
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

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