4. Data processing: measuring, calibrating, or testing
  5. Measurement system in a specific environment
  6. Electrical signal parameter measurement system

Naoyuki Kawabe

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Automatic circuit design apparatus, method for automatically...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Automatic circuit generation apparatus and method, and...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Logic circuit design equipment and method for designing...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Power consumption analyzing apparatus and power consumption...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate

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Semiconductor circuit having a combination circuit being...

Miscellaneous active electrical nonlinear devices – circuits – and – Signal converting – shaping – or generating – Particular stable state circuit
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Profile ID: LFUS-PAI-P-2342827

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