4. Static information storage and retrieval
  5. Read/write circuit
  6. Bad bit

Naoaki Kanagawa

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Redundancy circuit technique applied DRAM of multi-bit I/O havin

Static information storage and retrieval – Read/write circuit – Bad bit
Patent

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Semiconductor memory device of bit line twist system

Static information storage and retrieval – Read/write circuit – Bad bit
Reexamination Certificate

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Semiconductor storage device

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1427093

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