Static information storage and retrieval – Read/write circuit – Bad bit
Reexamination Certificate
2006-04-25
2006-04-25
Phung, Anh (Department: 2824)
Static information storage and retrieval
Read/write circuit
Bad bit
C365S201000, C714S048000
Reexamination Certificate
active
07035153
ABSTRACT:
A semiconductor memory device adopting a bit line twist system in which at least a part of bit lines are twisted, includes memory cell arrays each having a plurality of memory cells to store data, redundancy cell arrays each having a plurality of redundancy cells to replace a defective cell in the memory cell array, and a control circuit which performs control to invert a direction of the data. The device further includes an inversion circuit which inverts the direction of the data, in accordance with the control by the control circuit.
REFERENCES:
patent: 2001/0046166 (2001-11-01), Fischer et al.
patent: 2003/0002361 (2003-01-01), Fischer et al.
patent: 62-51096 (1987-03-01), None
patent: 6-314498 (1994-11-01), None
Hayashi Shintaro
Kanagawa Naoaki
Kawabata Mami
Satoh Manabu
Yoshihara Masahiro
Nguyen N
Phung Anh
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