4. Thermal measuring and testing
  5. Temperature measurement
  6. By electrical or magnetic heat sensor

Nail Khaliullin

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Active photosensitive structure with buried depletion layer

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having junction gate
Reexamination Certificate

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Active photosensitive structure with buried depletion layer

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Junction field effect transistor
Reexamination Certificate

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Active photosensitive structure with buried depletion layer

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Junction field effect transistor
Reexamination Certificate

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Temperature sensor, device and system including same, and...

Thermal measuring and testing – Temperature measurement – By electrical or magnetic heat sensor
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2278944

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