4. Measuring, testing, or signalling instruments
  5. Measuring, regulating or indicating instrument, or casing
  6. Electrical property

Munetoshi Nagasaka

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Ceramic mounting for wafer apparatus with thermal expansion...

Heat exchange – Heating and cooling – Heating and cooling of the same material
Reexamination Certificate

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Probe card transfer assist apparatus, and inspection...

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Reexamination Certificate

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Probe test apparatus

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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Wafer attracting plate

Equipment for production – distribution – or transformation of ene – Distribution – modification or control – Electron or vacuum tube
Design Patent

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Wafer prober

Measuring – testing – or signalling instruments – Measuring – regulating or indicating instrument – or casing – Electrical property
Patent

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Profile ID: LFUS-PAI-P-380741

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