Probe test apparatus

Details Probe test apparatus Probe test apparatus

1995-05-23

1997-02-18

Wieder, Kenneth A.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

414416, G01R 104

Patent

active

056044437

ABSTRACT:
A probe test apparatus comprising a test section for testing a wafer, a cassette having an opening at one side through which the wafer is taken into and out of the cassette, grooves formed in inner faces of both sides of the cassette to hold wafers therein, and a convex member projected downward from the underside of the cassette, a stage on which the cassette is mounted keeping the wafers therein substantially horizontal, and holder members projected upward from the top of the cassette-mounted stage and having a recess into which the convex member of the cassette falls, wherein when the convex member is not fitted into the recess but contacted with the holder members, the wafers in the cassette are tilted and when it is fitted into the recess, they can be kept substantially horizontal in the cassette to thereby position the cassette relative to the test section.

REFERENCES:
patent: 4775281 (1988-10-01), Prentakis
patent: 4901011 (1990-02-01), Koike et al.
patent: 5278494 (1994-01-01), Obigane

Affiliated with

Also associated with

Rating

Probe test apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Probe test apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Probe test apparatus will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1604565