4. Measuring and testing
  5. Embrittlement or erosion

Motoi Nakao

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Manufacturing apparatus for buried insulating layer-type...

Coating apparatus – Gas or vapor deposition
Reexamination Certificate

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Manufacturing device for buried insulating layer type single...

Metal working – Barrier layer or semiconductor device making
Reexamination Certificate

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Manufacturing method for buried insulating layer-type...

Semiconductor device manufacturing: process – Formation of semiconductive active region on any substrate – On insulating substrate or layer
Reexamination Certificate

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Manufacturing method of monocrystalline gallium nitride...

Semiconductor device manufacturing: process – Formation of semiconductive active region on any substrate – On insulating substrate or layer
Reexamination Certificate

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Material evaluation method

Measuring and testing – Embrittlement or erosion
Patent

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Profile ID: LFUS-PAI-P-1149627

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