4. Radiant energy
  5. Photocells; circuits and apparatus
  6. Optical or pre-photocell system

Michael D. Kirk

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Large stage system for scanning probe microscopes and other inst

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

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Methods and systems for detection of selected defects...

Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation
Reexamination Certificate

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Methods and systems for detection of selected defects...

Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation
Reexamination Certificate

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Piezoresistive cantilever with integral tip for scanning probe m

Radiant energy – Inspection of solids or liquids by charged particles
Patent

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Scanning force microscope having aligning and adjusting means

Radiant energy – Photocells; circuits and apparatus – Optical or pre-photocell system
Patent

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Profile ID: LFUS-PAI-P-358614

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