Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
Inventor
active
Deskewed differential detector employing analog-to-digital...
Enhanced loopback testing of serial devices
High speed serial data pin for automatic test equipment
Method for capturing digital data in an automatic test system
Pre-conditioner for measuring high-speed time intervals over...
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Profile ID: LFUS-PAI-P-518312