High speed serial data pin for automatic test equipment

Details High speed serial data pin for automatic test equipment High speed serial data pin for automatic test equipment

1996-04-26

1997-11-18

Beausoliel, Jr., Robert W.

Excavating

371 251, 371 27, 39542108, G01R 3128

Patent

active

056895151

ABSTRACT:
A tester that produces digital timing signals having fast data rates including multiple groups of timing generators, multiple "exclusive-or" gates, and an "or" gate. Each group of timing generators is connected to an exclusive-or gate, and the output of each exclusive-or gate is coupled to the or gate. The digital timing signals are encoded such that the timing generators in each group may assert timing pulses only during specified cycles within a series of clock cycles. Each combination of timing generators within a group either asserting their respective encoded timing signals, or not asserting any timing signals during the series of clock cycles, generates a unique serial data stream. The serial data streams generated by the groups of timing generators are then combined to produce a new digital timing signal having a data rate that is faster than the data rate of the encoded digital timing signals.

REFERENCES:
Robert J. Wenzel and David C. Keezer, "Extension of Digital Test System Data Rates to the Gigabit Per Second Range," Proceedings of Instrumentation and Measurement Conference, 1993, pp. 333-336.
D.C. Keezer and R.J. Wenzel, "Calibration Techniques for a Gigahertz Test System," Proceedings of International Test Conference, 1992, pp. 530-537.
David C. Keezer, "Multiplexing Test System Channels for Data Rates Above 1 Gb/s," Proceedings of International Test Conference, 1990, pp. 362-368.

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